PEER-REVIEWED JOURNAL PAPER PUBLICATIONS:

1)       Sayil, S., Boorla, V.K.,Yeddula, S.R., “Modeling Single Event Crosstalk in Nanometer Technologies”,  IEEE Transactions on Nuclear Science, Volume: 58 , Issue: 5 , Part: 2, pp. 2493 – 2502, October 2011. PDF.

2)       Sayil, S., Boorla, V. K., “Single event crosstalk prediction in nanometer technologies”,  Analog Integrated Circuits and Signal Processing, Volume 72 Issue 1, Pages 205-214, July 2012.

3)       Sayil, S., Wang, J., “Single Event Soft Errors in CMOS Logic”, IEEE Potentials, Vol.31,  Issue:2, pp. 15-22, April 2012.

4)       Sayil, S., Patel, N. B., “Soft Error and Soft Delay Mitigation using Dynamic Threshold Technique”, IEEE Transactions on Nuclear Science, Volume: 57, Issue: 6, Part: 1, Dec. 2010. PDF.

5)       Sayil, S., Akkur, A.B., “Mitigation for single event coupling delay”, International Journal of Electronics, Volume 97, Issue 1, pages 17 – 29, January 2010. PDF.

6)       Sayil, S., Akkur, A.B., Gaspard, N., “Single Event Crosstalk Shielding for CMOS Logic”, Microelectronics Journal, vol. 40, no. 6, 1000-1006, 2009.

7)      Sayil, S., Borra, U. K., “Coupling Delay Calculation Using Miller Factors under Exponential Waveforms”, International Journal of Electronics, vol. 96, no. 4, pp. 351 – 366, April 2009.   PDF.

8)      Sayil, S., Borra, U. K., “A Multiline Model for Time-Efficient Estimation of Crosstalk”, Analog Integrated Circuits and Signal Processing, vol. 59, no. 1, pp. 65 – 75, 2009.

9)       Sayil, S., “On the Use of Silicon Photonics- Part I”, IEEE Potentials,   vol. 28,,  no. 1,  pp. 35 – 39, January-February 2009  PDF.

10)    Sayil, S., “On the Use of Silicon Photonics- Part II”, IEEE Potentials,   vol. 28, no. 2, pp. 37 – 40, 2009. 

11)    Sayil, S., Rudrapati, M., “Accurate Prediction of Crosstalk for RC Interconnects”, Turkish Journal of Electrical Engineering (included in the Science Citation Index Expanded), Volume 17, Issue 1, pp. 55-67, 2009 PDF.

12)   Sayil, S., “Avalanche Breakdown in Silicon Devices for Contactless Logic Testing and Optical Interconnect”, Analog Integrated Circuits and Signal Processing, volume 56, no. 3, pp.  213-221, 2008.

13)    Gaspard, N., Sayil, S., “Single Event Transient Crosstalk Interconnect Shielding to Complete SEU hardening of CMOS Logic Gates”, The Lamar University Electronic Journal of Student Research, Volume VIII, 2008, PDF.

14)    Borra, U. K., Sayil, S., “Coupling Noise and Delay Estimation under Exponential type Waveforms”, The Lamar University Electronic Journal of Student Research, Volume IX, Fall 2008.

15)    Sayil, S., Rudrapati, M., “Precise Estimation Of Crosstalk In Multiline Circuits”, International Journal of Electronics, vol.95, no:4, April 2007.

16)    Sayil, S., "Optical Contactless Probing: An All-Silicon, Fully Optical Approach," IEEE Design and Test of Computers, vol. 23,  no. 2,  pp. 138-146,  Mar/Apr, 2006-Special Feature Article, (also listed on Journal cover) PDF.

17)    Anita, M., Sayil, S. “Time-Efficient Estimation of Crosstalk in Multi-Line Circuits”, The Lamar University Electronic Journal of Student Research, Volume III, 2006.

18)    Sayil, S., Kerns, D.V., Kerns, Sherra E. "Comparison of Contactless Measurement and Testing Techniques to a new All-Silicon Optical Test and Characterization Method”,  IEEE Transactions on Instrumentation and Measurement, Vol. 54, No. 5, pp. 2082-2089, October 2005,   PDF.

19)    Sayil, S., Kerns, D.V., Kerns, Sherra E., "A Survey of Contactless Measurement and Testing Techniques", IEEE Potentials, Feb/March 2005 issue, pp.. 25-28, (listed on IEEE Potentials cover)   PDF.

20)    Sayil, S., Kerns, D.V., Kerns, Sherra E. "All-Silicon Optical Contactless Testing Of Integrated Circuits" International Journal of Electronics Vol.89, no. 7 July 2002  p.537-547. PDF, PS .

21)    Sayil, S., "A Combine Algorithm For A CMAC Network”, PAU Journal of Engineering Science, September 2001 issue, PDF .

 

FUNDING OBTAINED:

·          “Low Power Radiation Tolerant VLSI Design for Advanced Spacecraft”, Texas Space Grant Consortium (TSGC)/ NASA New Investigations Program (NIP), October 2010, PI, $9,000.

·         “Studying the Impact of Power Optimizations on Microchip Radiation Tolerance”, Lamar Research Enhancement Grant, Spring 2010, PI, $5,000.

·         “Space Radiation Effects on Technology and Human Biology and Proper Mitigation Techniques”, Texas Space Grant Consortium (TSGC) / NASA Higher Education, March 2008, PI, $15,000.

·         “Modeling the Effect of Ionizing Radiation on Circuit Delay for Today’s Advanced Microchip Technologies”, Lamar Research Enhancement Grant, Spring 2009, PI, $5,000.

·         “The Impact of Radiation Induced Single Event Upsets on Cross-talk Noise for Today’s Advanced Microchip Technologies”, Lamar Research Enhancement Grant, Spring  2007, PI, $5,000

·         “Modeling the Impact of Cross-Coupling Noise on Wire Delay for Today’s Microchip Technologies”, Lamar Research Enhancement Grant – Spring 2006, PI, $5,000.

·         “Evaluation of Existing Test Sets for Crosstalk Test Coverage using VHDL Hardware Description Language”, Lamar Research Enhancement Grant – Spring 2004, PI, $5,000.

·         “A New Time-Efficient Method for Precise Estimation of Cross-talk Noise on Multi-line Circuits”, Lamar Research Enhancement Grant – Fall 2003, PI, $5,000.

 

BOOK CHAPTER:

 

      “Advanced Circuits for Emerging Technologies”, Publisher: Wiley, Publication Date: May 2012 ,  ISBN-10: 0470900059

 

       Chapter 23 - Selahattin Sayil, Lamar University, Contactless Measurement and Testing 

                         Techniques”

                 

  EDITORSHIP:

        (1)   Associate Editor for International Journal of Electronics,  October 2008-Present.

 

CONFERENCE PAPERS

·         Sayil, S., Boorla, V. K., “Modeling Single Event Crosstalk in Nanometer Technologies”, Proceedings of the International Conference on Electrical and Electronics Engineering , ELECO'11, 7-11 Nov, Bursa, TURKEY.

·         Sayil, S., Rudrapati, M. S., Borra, U. K., "An Improved Multiline model for Precise Estimation of Crosstalk", Proceedings of the 2007 IEEE Region 5 Technical Conference, pp. 239-245,  April 20-21, Fayetteville, AR, U.S.A.

·         Sayil, S., "On the Use of Silicon Photonics for Optical Interconnect and Contactless Logic Testing ", Proceedings of the 2007 IEEE Region 5 Technical Conference, pp. 42-48, April 20-21, Fayetteville, AR, U.S.A.

·         Sayil, S., Kerns, D.V., Kerns, Sherra E., "All-Silicon Optical Technology For Contactless Testing Of Integrated Circuits", Proceedings of the International Conference on Electrical and Electronics Engineering , ELECO'01, 7-11 Nov, Bursa, TURKEY. PDF.

·         Sayil, S. Lee, K.Y. "An Hybrid Neighborhood Training and Maximum Error Algorithm for CMAC", Proceedings of the 2002 World Congress on Computational Intelligence, 5, 31 2002,Honolulu, HI, U.S.A., PDF. 

 

PROFESSIONAL DEVELOPMENT ACTIVITIES:

 

  • Attended the “National Science Foundation (NSF) one-day workshop” at Texas A&M University-Commerce on November 14, 2011.
  • Attended the “7th International Conference on Electrical and Electronics Engineering ELECO” Conference, Bursa, TURKEY, Dec. 1-3, 2011.
  • Attended 2010 Nuclear and Space Radiation Effects (NSREC) Short Course, Denver, CO
  • Attended 2010 NSREC Conference, Denver, CO.
  • Attended 2010 NSREC Radiation Effects Data Workshop, Denver, CO.

 

 TECHNICAL REPORTS, DISSERTATION

1.    Sayil, S., “Space Radiation Effects on Technology and Human Biology and Proper Mitigation Techniques”, Texas Space Grant Consortium (TSGC) Higher Education Grant Final Report, July 2010

2.    Sayil, S., “The Impact of Radiation Induced Single Event Upsets on Cross-talk Noise for Today’s Advanced Microchip Technologies”, Lamar Research Enhancement Grant Final Report, August 2008.

3.    Sayil, S., “Modeling the Impact of Cross-Coupling Noise on Wire Delay for Today’s Microchip Technologies”, Lamar Research Enhancement Grant Final Report, August 2007.

4.    Sayil, S., “Modeling the Impact of Cross-Coupling Noise on Wire Delay for Today’s Microchip Technologies”, Lamar Research Enhancement Progress Report, April 2007.

5.    Sayil, S., “Evaluation of Existing Test Sets for Crosstalk Test Coverage using VHDL  Hardware Description Language”, Lamar Research Enhancement Grant Final Report, August 2005.

6.    Sayil, S., “Evaluation of Existing Test Sets for Crosstalk Test Coverage using VHDL  Hardware Description Language”, Lamar Research Enhancement Progress Report, April 2005.

7.    Sayil, S., “A New Accurate and Time-Efficient Method for Cross-talk Noise Estimation on Multi-line Circuits”, Lamar Research Enhancement Grant Final Report, August 2004.

8.    Sayil, S., “A New Accurate and Time-Efficient Method for Cross-talk Noise Estimation on Multi-line Circuits”, Lamar Research Enhancement Progress Report, April 2004.

9.    Sayil, S., “All-Silicon Optical Contactless Testing Of Integrated Circuits", Ph.D. Dissertation,  Vanderbilt University, Nashville, TN, USA.

 

PRESENTATIONS:

·         Sayil, S., Boorla, V. K., “Modeling Single Event Crosstalk in Nanometer Technologies”, International Conference on Electrical and Electronics Engineering ELECO'11, 7-11 Nov, Bursa, TURKEY.

·         Sayil, S., Patel, N., “Soft Error and Soft Delay Mitigation using a Dynamic Threshold Scheme”, Nuclear and Space Radiation Effects Conference, NSREC, 2010.

·         Sayil, S., Rudrapati, M. S., Borra, U. K., "An Improved Multiline model for Precise Estimation of Crosstalk", 2007 IEEE Region 5 Technical Conference, April 20-21, Fayetteville, AR, U.S.A.

·         Sayil, S., “On the Use of Silicon Photonics for Optical Interconnect and Contactless Logic Testing”, 2007 IEEE Region 5 Technical Conference, April 20-21, Fayetteville, AR, U.S.A.

·         Sayil,S., Lee, K.Y. “An Hybrid Neighborhood Training and Maximum Error Algorithm for CMAC", 2002 World Congress on Computational Intelligence, May 2002.

·         Sayil, S., Kerns, D.V., Kerns, Sherra E., “All-Silicon Optical Technology for Contactless Testing of Integrated Circuits”, Presented at the International Conference on Electrical and Electronics Engineering ELECO'01, 7-11 Nov, Bursa, Turkey, 2002.

·         Sayil, S., “A Novel Contactless Scheme for IC Testing”, Pamukkale University, Denizli, Turkey, 2001.

 

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